Lynium LLC
Phone: (520) 579-0047

Products - ATS4000

Lynium's main product is the ATS4000, a test system that has been used by major semiconductor companies for characterizing, validating, debugging and evaluating numerous analog-to-digital converters (ADCs) and digital-to-analog converters (DACs). This system has been used to test a wide range of such devices. This includes 12-bit ADCs and DACs embedded into microcontrollers, industrial delta-sigma converters up to 24-bits, a 14-bit 125 MHz ADC, a dual 18-bit SAR ADCs operating up to 2 MSPS, and various ICs used for power metering.

We offer two main paths for our customers: custom test heads that are designed and validated by Lynium for testing a particular product or family of products and "generic" test heads which allow the end-user to test typical ADCs or DACs. An example of the later test head is the GAP1616 platform which allows for testing discrete or embedded ADCs (see the GAP1616 Test Head Manual for more information).

An example ATS4000 setup is shown below:

ATS4000 Setup

A typical ATS4000 setup consists of the ATS4000 test system, various pieces of test equipment, an IBM-compatible PC, and one or more test heads. The minimum external equipment that is required varies depending on the device being tested. All devices require an HP/Agilent/Keysight 3458 Digital Multimeter (or Keithley 2002 Digital Multimeter). Many devices also require an Agilent/Keysight 33250A 80 MHz Function/Arbitrary Waveform Generator (or Agilent 33120A 15 MHz Function/Arbitrary Waveform Generator). Additional equipment may be required depending on the tests to be performed and the speed of the device to be tested.

The ATS4000 currently provides three main types of tests: dynamic ("AC") testing, static linearity ("DC") testing, and transfer linearity testing. AC testing provides results such as signal-to-noise ratio (SNR) and total harmonic distortion (THD). DC testing provides integral non-linearity (INL) and differential non-linearity (DNL) results. The ATS4000 uses an "analog servo-loop" circuit when testing ADCs for linearity. Transfer linearity provides INL and noise for high-resolution converters such as 24-bit delta-sigma converters.

If you have questions, do not hesitate to contact us.

Lynium LLC: Home Page, Products, Services, Support, FAQs, Privacy Information, or About Us.