Lynium's main product is the ATS4000, a test system that can be used for characterizing, validating, and evaluating ADCs and DACs. This flexible system has been used to test a wide range of such devices, including a 7.5 Hz, 24-bit delta-sigma ADC; a 30 MHz, 10-bit ADC; a 16-bit, 1 MHz ADC; a 10-bit, 15 MHz DAC; and a quad 16-bit DAC.
We offer two main paths for our customers: custom test heads that are designed and validated by Lynium for testing a particular product or family of products and "generic" test heads which allow the end-user to test typical ADCs or DACs. An example of the later test head is the GAP1616 platform which allows for testing discrete or embedded ADCs (see the GAP1616 Test Head Manual for more information).
An example ATS4000 setup is shown below:
A typical ATS4000 setup consists of the ATS4000 test system, various pieces of test equipment, an IBM-compatible PC, and one or more test heads. The minimum external equipment that is required is an Agilent 3458 Digital Multimeter (or Keithley 2002 Digital Multimeter) and an Agilent 33250A 80 MHz Function/Arbitrary Waveform Generator (or Agilent 33120A 15 MHz Function/Arbitrary Waveform Generator). Additional equipment may be required depending on the tests to be performed and the speed of the device to be tested.
The ATS4000 currently provides three main types of tests: dynamic ("AC") testing, static linearity ("DC") testing, and transfer linearity testing. AC testing provides results such as signal-to-noise ratio (SNR) and total harmonic distortion (THD). DC testing provides integral non-linearity (INL) and differential non-linearity (DNL) results. The ATS4000 uses a "servo-loop" circuit when testing ADCs for linearity. Transfer linearity provides INL and noise for high-resolution converters such as 24-bit delta-sigma converters.
This page is currently being updated and more information regarding the ATS4000 will be included shortly. If you have questions, do not hesitate to contact us.