This PDF document describes the general philosophy beyond the ATS4000 with some additional information regarding the overall design and operation of the test system.
This PDF document details the basic AC and DC tests that can be performed with the ATS4000 on a typical ADC.
This PDF document explains the source of many offset error and gain error correlation issues that are common with ADCs. This applies to correlation between any two ADC test systems, but the document focuses on possible error sources between the ATS4000 and production test equipment. Possible solutions are described and discussed.
This PDF document provides information for users of the General Access Platform (GAP) 1616. This test head and associated hardware enable end-users to test many discrete and embedded ADCs on the ATS4000.
This application note documents the testing of a 16-bit ADC that is embedded in Silicon Laboratories' (formerly Cygnal Integrated Products) C8051F060 microcontroller on the General Access Platform (GAP) 1616. This application note should be of particular interest to users that are new to the ATS4000 and GAP1616 or anyone testing embedded ADCs.